• Woojin Soh 

Ph.D., 2015, "Development and Comparison of Parameter Design Methods for Multiple Performance Characteristics"

Affiliation : NVIDIA

• Youngmin Lee 

Ph.D., 2020, "Bayesian Nonparametric Models for Spatial Data Analysis"

Affiliation : Samsung Electronics

• Taewon Jeong

Ph.D., 2021, "Machine Learning Methods for Black-Box Optimization and Image Classification"

Affiliation : Samsung Electronics

• Hyojoong Kim

Ph.D., 2022, "Machine Learning Methods for Contextual Anomaly Detection"

Affiliation : Samsung Electronics

• Keunseo Kim

Ph.D., 2022, "Deep Learning Methods for Anomaly Detection and Robust Density Estimation"

Affiliation : Samsung Advanced Institute of Technology 

• Jinman Bak

Ph.D., 2022, "Few-Shot Out-of-Distribution Detection and Classification for Mixed-Type Defect Patterns"

Affiliation : Defense Agency of Technology and Quality (DTaQ)

• Woojin Doo

Ph.D., 2022, "Simultaneous Clustering and Feature Selection for High-dimensional Data"

Affiliation : Samsung Electronics

• Jaehwan Lee 

M.S., 2016, "Hierarchical Spatially Varying Coefficient Process Models with Application to Housing Market Analysis"

Affiliation : SK Telecom

• Yonghan Jung

M.S., 2016, "Detection of Premature Ventricular Contraction Using Wavelet-Based Statistical ECG Monitoring"

Affiliation : Purdue University 

•  Hyojoong Kim

M.S., 2016, "Functional Logistic Regression with Fused Lasso Penalty"

Affiliation : Ph.D. student in iStat Lab 

• Jinho Kim

M.S., 2016, "Detection and Clustering of Mixed-Type Defect Patterns in Wafer Bin Maps"

Affiliation : SK Hynix

• Keunseo Kim

M.S., 2016, "TrailSense :  A Crowdsensing System for Detecting Risky Mountain Trail Segments with Walking Pattern Analysis"

Affiliation : Ph.D. student in iStat Lab 

• Jihoon Chung 

M.S., 2017, "Crime Risk Maps : Multivariate Analysis of Spatial Crime Data"

Affiliation : Virginia Tech.

• Vinnam Kim 

M.S., 2017, "Spatio-Temporal Autoregressive Models of Monthly Air Passenger Flows "

Affiliation : NCSoft

• Kiryong Kyeong 

M.S., 2018, "Classification of Mixed-Type Defects Patterns in Wafer Bin Maps Using Convolutional Neural Networks"

Affiliation : NCSoft

• Woojin Doo

M.S., 2018, "Modeling the Probability of A Batter/Pitcher Matchup Dvent : A Bayesian Approach "

Affiliation : Ph.D. student in iStat Lab 

• Taeyoung Ko

M.S., 2019, "Fault Diagnosis for High-Dimensional Complex Process Using Semi-Dupervised Deep Convolutional Generative Models"

Affiliation : NICE

• Jeonghyun Choi

M.S., 2019, "Improving Baseball Pitch Type Classification Through Clustering of Pitchers"

Affiliation : TmaxSoft

• Eunyeol Ma

M.S., 2019, "Phenotyping Obstructive  Sleep Apnea Patients and Prognosis of Their Comorbidities Through Machine Learning Methods"

Affiliation : Ph.D. student in iStat Lab 

• Wonmo Koo

M.S., 2019, "Bayesian Nonparametric Latent Class Model for Longitudinal Data "

Affiliation : Ph.D. student in iStat Lab 

• Jongwoo Ko

M.S., 2020, "Deep Gaussian Process Models for Integrating Multifidelity Experiments Having Non-stationary Relationship"

Affiliation : Graduate School of AI,  KAIST

• Hyuk Lee

M.S., 2020, "Semi-Supervised Multi-Label Learning for Classification of Wafer Bin Maps with Mixed-type Defect Patterns"

Affiliation : Ph.D. student in iStat Lab 

• Yunseung Hyun

M.S., 2020, "Memory-Augmented Convolutional Neural Networks with Triplet Loss for Imbalanced Wafer Defect Pattern Classification"

• Jonghyun Hwang

M.S., 2020, "Variational Deep Clustering of Wafer Map Patterns"

Affiliation : Samsung Electronics

• Sumin Park

M.S., 2021, "A Bayesian Deep Learning Method for Predicting Highly Imbalanced Package Test Results"

Affiliation : SK Hynix

• Sumin Kim

M.S., 2021, "Noisy Label Correction for Classification of Wafer Bin Maps with Mixed-Type Defect Patterns"

Affiliation : Hyundai Card

• Junsub Jung

M.S., 2021, "Location Dependent Dirichlet Process Mixture Model for Clustering Spatially Correlated Time Series"

Affiliation : Ph.D. student in iStat Lab

• Jaehyun Lee

M.S., 2022, "Semi-Supervised Learning for Simultaneous Location Detection and Classification of Mixed-Type Defect Patterns in Wafer Bin Maps"

Affiliation : Samsung Electronics

• Junchul Shin

M.S., 2022, "Open Set Recognition of Wafer Bin Map Defect Patterns"

Affiliation : ClassOn

• Hyeonwoo Kim

M.S., 2022, "Weakly Supervised Semantic Segmentation for Classifying Wafer Chip-Level Defect Types"

Affiliation : Upstage

• Hunsung Cho

M.S., 2023, "Prediction of Highly Imbalanced Semiconductor Chip-Level Defects in Module Tests Using Multimodal Fusion and Logit Adjustment"

Affiliation : SK Hynix

• Hyeonwoo Kim

M.S., 2023, "Few-Shot Classification of Wafer Bin Maps Using Transfer Learning and Ensemble Learning"

• Jeongman Choi

M.S., 2023, "Classification and Out-of-Distribution Detection for Wafer Bin Maps"