Alumni
Ph.D.
Woojin Soh
Ph.D., 2015, "Development and Comparison of Parameter Design Methods for Multiple Performance Characteristics"
Affiliation : NVIDIA
Youngmin Lee
Ph.D., 2020, "Bayesian Nonparametric Models for Spatial Data Analysis"
Affiliation : Samsung Electronics
Taewon Jeong
Ph.D., 2021, "Machine Learning Methods for Black-Box Optimization and Image Classification"
Affiliation : Samsung Electronics
Hyojoong Kim
Ph.D., 2022, "Machine Learning Methods for Contextual Anomaly Detection"
Affiliation : Samsung Electronics
Keunseo Kim
Ph.D., 2022, "Deep Learning Methods for Anomaly Detection and Robust Density Estimation"
Affiliation : Samsung Advanced Institute of Technology
Jinman Bak
Ph.D., 2022, "Few-Shot Out-of-Distribution Detection and Classification for Mixed-Type Defect Patterns"
Affiliation : Defense Agency of Technology and Quality (DTaQ)
Woojin Doo
Ph.D., 2022, "Simultaneous Clustering and Feature Selection for High-dimensional Data"
Affiliation : Samsung Electronics
M.S.
Jaehwan Lee
M.S., 2016, "Hierarchical Spatially Varying Coefficient Process Models with Application to Housing Market Analysis"
Affiliation : SK Telecom
Yonghan Jung
M.S., 2016, "Detection of Premature Ventricular Contraction Using Wavelet-Based Statistical ECG Monitoring"
Affiliation : Purdue University
Hyojoong Kim
M.S., 2016, "Functional Logistic Regression with Fused Lasso Penalty"
Affiliation : Ph.D. student in iStat Lab
Jinho Kim
M.S., 2016, "Detection and Clustering of Mixed-Type Defect Patterns in Wafer Bin Maps"
Affiliation : SK Hynix
Keunseo Kim
M.S., 2016, "TrailSense : A Crowdsensing System for Detecting Risky Mountain Trail Segments with Walking Pattern Analysis"
Affiliation : Ph.D. student in iStat Lab
Jihoon Chung
M.S., 2017, "Crime Risk Maps : Multivariate Analysis of Spatial Crime Data"
Affiliation : Virginia Tech.
Vinnam Kim
M.S., 2017, "Spatio-Temporal Autoregressive Models of Monthly Air Passenger Flows "
Affiliation : NCSoft
Kiryong Kyeong
M.S., 2018, "Classification of Mixed-Type Defects Patterns in Wafer Bin Maps Using Convolutional Neural Networks"
Affiliation : NCSoft
Woojin Doo
M.S., 2018, "Modeling the Probability of A Batter/Pitcher Matchup Dvent : A Bayesian Approach "
Affiliation : Ph.D. student in iStat Lab
Taeyoung Ko
M.S., 2019, "Fault Diagnosis for High-Dimensional Complex Process Using Semi-Dupervised Deep Convolutional Generative Models"
Affiliation : NICE
Jeonghyun Choi
M.S., 2019, "Improving Baseball Pitch Type Classification Through Clustering of Pitchers"
Affiliation : TmaxSoft
Eunyeol Ma
M.S., 2019, "Phenotyping Obstructive Sleep Apnea Patients and Prognosis of Their Comorbidities Through Machine Learning Methods"
Affiliation : Ph.D. student in iStat Lab
Wonmo Koo
M.S., 2019, "Bayesian Nonparametric Latent Class Model for Longitudinal Data "
Affiliation : Ph.D. student in iStat Lab
Jongwoo Ko
M.S., 2020, "Deep Gaussian Process Models for Integrating Multifidelity Experiments Having Non-stationary Relationship"
Affiliation : Graduate School of AI, KAIST
Hyuk Lee
M.S., 2020, "Semi-Supervised Multi-Label Learning for Classification of Wafer Bin Maps with Mixed-type Defect Patterns"
Affiliation : Ph.D. student in iStat Lab
Yunseung Hyun
M.S., 2020, "Memory-Augmented Convolutional Neural Networks with Triplet Loss for Imbalanced Wafer Defect Pattern Classification"
Jonghyun Hwang
M.S., 2020, "Variational Deep Clustering of Wafer Map Patterns"
Affiliation : Samsung Electronics
Sumin Park
M.S., 2021, "A Bayesian Deep Learning Method for Predicting Highly Imbalanced Package Test Results"
Affiliation : SK Hynix
Sumin Kim
M.S., 2021, "Noisy Label Correction for Classification of Wafer Bin Maps with Mixed-Type Defect Patterns"
Affiliation : Hyundai Card
Junsub Jung
M.S., 2021, "Location Dependent Dirichlet Process Mixture Model for Clustering Spatially Correlated Time Series"
Affiliation : Ph.D. student in iStat Lab
Jaehyun Lee
M.S., 2022, "Semi-Supervised Learning for Simultaneous Location Detection and Classification of Mixed-Type Defect Patterns in Wafer Bin Maps"
Affiliation : Samsung Electronics
Junchul Shin
M.S., 2022, "Open Set Recognition of Wafer Bin Map Defect Patterns"
Affiliation : ClassOn
Hyeonwoo Kim
M.S., 2022, "Weakly Supervised Semantic Segmentation for Classifying Wafer Chip-Level Defect Types"
Affiliation : Upstage
Hunsung Cho
M.S., 2023, "Prediction of Highly Imbalanced Semiconductor Chip-Level Defects in Module Tests Using Multimodal Fusion and Logit Adjustment"
Affiliation : SK Hynix
Hyeonwoo Kim
M.S., 2023, "Few-Shot Classification of Wafer Bin Maps Using Transfer Learning and Ensemble Learning"
Jeongman Choi
M.S., 2023, "Classification and Out-of-Distribution Detection for Wafer Bin Maps"