## Alumni

## Ph.D.

Woojin Soh

Ph.D., 2015, "Development and Comparison of Parameter Design Methods for Multiple Performance Characteristics"

Affiliation : NVIDIA

Youngmin Lee

Ph.D., 2020, "Bayesian Nonparametric Models for Spatial Data Analysis"

Affiliation : Samsung Electronics

Taewon Jeong

Ph.D., 2021, "Machine Learning Methods for Black-Box Optimization and Image Classification"

Affiliation : Samsung Electronics

Hyojoong Kim

Ph.D., 2022, "Machine Learning Methods for Contextual Anomaly Detection"

Affiliation : Samsung Electronics

Keunseo Kim

Ph.D., 2022, "Deep Learning Methods for Anomaly Detection and Robust Density Estimation"

Affiliation : Samsung Advanced Institute of Technology

Jinman Bak

Ph.D., 2022, "Few-Shot Out-of-Distribution Detection and Classification for Mixed-Type Defect Patterns"

Affiliation : Defense Agency of Technology and Quality (DTaQ)

Woojin Doo

Ph.D., 2022, "Simultaneous Clustering and Feature Selection for High-dimensional Data"

Affiliation : Samsung Electronics

## M.S.

Jaehwan Lee

M.S., 2016, "Hierarchical Spatially Varying Coefficient Process Models with Application to Housing Market Analysis"

Affiliation : SK Telecom

Yonghan Jung

M.S., 2016, "Detection of Premature Ventricular Contraction Using Wavelet-Based Statistical ECG Monitoring"

Affiliation : Purdue University

Hyojoong Kim

M.S., 2016, "Functional Logistic Regression with Fused Lasso Penalty"

Affiliation : Ph.D. student in iStat Lab

Jinho Kim

M.S., 2016, "Detection and Clustering of Mixed-Type Defect Patterns in Wafer Bin Maps"

Affiliation : SK Hynix

Keunseo Kim

M.S., 2016, "TrailSense : A Crowdsensing System for Detecting Risky Mountain Trail Segments with Walking Pattern Analysis"

Affiliation : Ph.D. student in iStat Lab

Jihoon Chung

M.S., 2017, "Crime Risk Maps : Multivariate Analysis of Spatial Crime Data"

Affiliation : Virginia Tech.

Vinnam Kim

M.S., 2017, "Spatio-Temporal Autoregressive Models of Monthly Air Passenger Flows "

Affiliation : NCSoft

Kiryong Kyeong

M.S., 2018, "Classification of Mixed-Type Defects Patterns in Wafer Bin Maps Using Convolutional Neural Networks"

Affiliation : NCSoft

Woojin Doo

M.S., 2018, "Modeling the Probability of A Batter/Pitcher Matchup Dvent : A Bayesian Approach "

Affiliation : Ph.D. student in iStat Lab

Taeyoung Ko

M.S., 2019, "Fault Diagnosis for High-Dimensional Complex Process Using Semi-Dupervised Deep Convolutional Generative Models"

Affiliation : NICE

Jeonghyun Choi

M.S., 2019, "Improving Baseball Pitch Type Classification Through Clustering of Pitchers"

Affiliation : TmaxSoft

Eunyeol Ma

M.S., 2019, "Phenotyping Obstructive Sleep Apnea Patients and Prognosis of Their Comorbidities Through Machine Learning Methods"

Affiliation : Ph.D. student in iStat Lab

Wonmo Koo

M.S., 2019, "Bayesian Nonparametric Latent Class Model for Longitudinal Data "

Affiliation : Ph.D. student in iStat Lab

Jongwoo Ko

M.S., 2020, "Deep Gaussian Process Models for Integrating Multifidelity Experiments Having Non-stationary Relationship"

Affiliation : Graduate School of AI, KAIST

Hyuk Lee

M.S., 2020, "Semi-Supervised Multi-Label Learning for Classification of Wafer Bin Maps with Mixed-type Defect Patterns"

Affiliation : Ph.D. student in iStat Lab

Yunseung Hyun

M.S., 2020, "Memory-Augmented Convolutional Neural Networks with Triplet Loss for Imbalanced Wafer Defect Pattern Classification"

Jonghyun Hwang

M.S., 2020, "Variational Deep Clustering of Wafer Map Patterns"

Affiliation : Samsung Electronics

Sumin Park

M.S., 2021, "A Bayesian Deep Learning Method for Predicting Highly Imbalanced Package Test Results"

Affiliation : SK Hynix

Sumin Kim

M.S., 2021, "Noisy Label Correction for Classification of Wafer Bin Maps with Mixed-Type Defect Patterns"

Affiliation : Hyundai Card

Junsub Jung

M.S., 2021, "Location Dependent Dirichlet Process Mixture Model for Clustering Spatially Correlated Time Series"

Affiliation : Ph.D. student in iStat Lab

Jaehyun Lee

M.S., 2022, "Semi-Supervised Learning for Simultaneous Location Detection and Classification of Mixed-Type Defect Patterns in Wafer Bin Maps"

Affiliation : Samsung Electronics

Junchul Shin

M.S., 2022, "Open Set Recognition of Wafer Bin Map Defect Patterns"

Affiliation : ClassOn

Hyeonwoo Kim

M.S., 2022, "Weakly Supervised Semantic Segmentation for Classifying Wafer Chip-Level Defect Types"

Affiliation : Upstage

Hunsung Cho

M.S., 2023, "Prediction of Highly Imbalanced Semiconductor Chip-Level Defects in Module Tests Using Multimodal Fusion and Logit Adjustment"

Affiliation : SK Hynix

Hyeonwoo Kim

M.S., 2023, "Few-Shot Classification of Wafer Bin Maps Using Transfer Learning and Ensemble Learning"

Jeongman Choi

M.S., 2023, "Classification and Out-of-Distribution Detection for Wafer Bin Maps"